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Modeling a Growth Instability in Stressed Boron Doped Silicon
(Applied Computational Research Society; Nano science and technology institute, 2012-06-07)
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Aziz, Michael (1)
Barvosa-Carter, William (1)
Gray, Leonard J. (1)
Kaplan, Ted (1)
Phan, Anh Vu (1)Subjectboundary contour method (1)growth instability (1)ion-implantation (1)level set methods (1)
stressed boron doped silicon (1)
... View MoreDate Issued2012 (1)Has File(s)No (1)